14 July 2000 Design and implementation of a new UHV threshold cathode test facility
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Proceedings Volume 4031, Intense Microwave Pulses VII; (2000); doi: 10.1117/12.391799
Event: AeroSense 2000, 2000, Orlando, FL, United States
Abstract
In support of cathode development at the Air Force Research Laboratory, a new ultra-high vacuum cathode test facility is being assembled to complement the existing repetition-rate test pulser. The existing test bed is a 500 kV, 100 Ohm, 1 microsecond(s) duration pulser capable of firing at up to 1 Hz. The new facility is designed to operate at lower voltages (20 - 200 kv), lower impedance (50 - 75 Ohm), and variable pulse lengths (200 - 800 ns) in a single-shot mode. This Threshold Cathode Test Facility (TCTF) will be used to generate data regarding emission turn-on field strengths, outgassing volumes and constituents, vacuum level effects, and anode effects for a variety of field-emitting and explosive- emitting cathode materials. Presented herein are the design parameters of TCTF including diagnostic capabilities and electrostatic simulations of the diode region both with and without beam current.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryan J. Umstattd, Donald A. Shiffler, C. A. Baca, K. J. Hendricks, Thomas A. Spencer, John W. Luginsland, "Design and implementation of a new UHV threshold cathode test facility", Proc. SPIE 4031, Intense Microwave Pulses VII, (14 July 2000); doi: 10.1117/12.391799; https://doi.org/10.1117/12.391799
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KEYWORDS
Electrodes

Diodes

Explosives

High power microwaves

Pulsed power

Analytical research

Diagnostics

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