14 July 2000 Pulsed rf breakdown studies
Author Affiliations +
A series of experiments have been conducted to investigate the critical mechanisms involved in pulsed rf breakdown. This research has examined fundamental issues such as microparticle contamination, grain boundaries, residual gas, pulse duration, field emission, and the spatial distribution of plasma during a breakdown event. The motivation of this research is to gain a clearer understanding of the processes involved in breakdown and to determine methods to increase the breakdown threshold thereby increasing the available power in high power microwave sources and accelerator components.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lisa Laurent, Lisa Laurent, George Caryotakis, George Caryotakis, Glenn P. Scheitrum, Glenn P. Scheitrum, Daryl Sprehn, Daryl Sprehn, Neville C. Luhmann, Neville C. Luhmann, "Pulsed rf breakdown studies", Proc. SPIE 4031, Intense Microwave Pulses VII, (14 July 2000); doi: 10.1117/12.391793; https://doi.org/10.1117/12.391793

Back to Top