Full-face full-complex characterization of a reflective SLM

Richard D. Juday; John Michael Rollins; Stanley E. Monroe Jr.; Michael V. Morelli

doi:10.1117/12.381582

31 March 2000 Full-face full-complex characterization of a reflective SLM

Richard D. Juday, John Michael Rollins, Stanley E. Monroe Jr., Michael V. Morelli

Proceedings Volume 4043, Optical Pattern Recognition XI; (2000) https://doi.org/10.1117/12.381582
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

We report algorithms and laboratory practices that tell the full complex behavior of an SLM over its entire face, pixel by pixel, and put the information into a form that is useful to our filter optimization code. We add a quadrature component to the interferometry and image each pixel of the SLM. We analyze the fringes not at one value of drive and in an across-pixels dimension, but instead at each pixel in the drive dimension. We describe details of the method and given examples of spatially-variant filter SLM behavior. We provide examples of performance degradation when the filter's spatial variance has not been accommodated.

Citation Download Citation

Richard D. Juday, John Michael Rollins, Stanley E. Monroe Jr., and Michael V. Morelli "Full-face full-complex characterization of a reflective SLM", Proc. SPIE 4043, Optical Pattern Recognition XI, (31 March 2000); https://doi.org/10.1117/12.381582

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