Paper
17 July 2000 Adaptive imaging system using image quality metric based on statistical analysis of speckle fields
Author Affiliations +
Abstract
This paper describes an Opto-Silicon Adaptive Imaging (OSAI) system capable of operating at low light intensities with high resolution, high accuracy, wide dynamic range, and high speed. The system consists of three major subsystems: (1) an adaptive imaging system in which a liquid crystal wavefront corrector measures image quality based on statistical analysis of a speckle field; (2) an image quality analyzer (IQA); (3) an opto-silicon multi-chip module combining a high-resolution ferroelectric liquid crystal SLM, CCD photodetector array, field-programmable gate array, and digital signal processor. The OSAI wavefront control applies adaptive optoelectronic feedback for iterative wavefront restoration and distortion compensation, suing an image quality metric based on statistical properties of the speckle field produced by moving a diffuser in the Fourier transform plane of a IQA optical system. A prototype IQA system was designed, manufactured, and tested using an input liquid crystal SLM, a Fourier lens, a light-shaping diffuser, and an output photodiode.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dai Hyun Kim, Kirill Kolesnikov, Andrew A. Kostrzewski, Gajendra D. Savant, Anatoly A. Vasiliev, and Mikhail A. Vorontsov "Adaptive imaging system using image quality metric based on statistical analysis of speckle fields", Proc. SPIE 4044, Hybrid Image and Signal Processing VII, (17 July 2000); https://doi.org/10.1117/12.391929
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image quality

Spatial light modulators

Speckle

Imaging systems

Wavefronts

Digital signal processing

Phase modulation

Back to Top