5 April 2000 Test point selection using wavelet transforms for mixed-signal circuits
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Abstract
With growing complexity of today's ICs, it is desirable to improve traditional testing methods to increase the IC manufacturing throughput. If one can select a limited number of points to test the circuit from a given test pattern, the time required for testing can be greatly reduced. This paper presents a method for circuit testing by combining the wavelet transform and test point selection. An example using an 8-bit D/A converter is used to demonstrate the algorithm.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hsing-Chiang Huang, Andrew K. Chan, "Test point selection using wavelet transforms for mixed-signal circuits", Proc. SPIE 4056, Wavelet Applications VII, (5 April 2000); doi: 10.1117/12.381711; https://doi.org/10.1117/12.381711
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