With growing complexity of today's ICs, it is desirable to improve traditional testing methods to increase the IC manufacturing throughput. If one can select a limited number of points to test the circuit from a given test pattern, the time required for testing can be greatly reduced. This paper presents a method for circuit testing by combining the wavelet transform and test point selection. An example using an 8-bit D/A converter is used to demonstrate the algorithm.
Andrew K. Chan,
"Test point selection using wavelet transforms for mixed-signal circuits", Proc. SPIE 4056, Wavelet Applications VII, (5 April 2000); doi: 10.1117/12.381711; https://doi.org/10.1117/12.381711