Test point selection using wavelet transforms for mixed-signal circuits

Hsing-Chiang Huang; Andrew K. Chan

doi:10.1117/12.381711

5 April 2000 Test point selection using wavelet transforms for mixed-signal circuits

Hsing-Chiang Huang; Andrew K. Chan

Author Affiliations +

Proceedings Volume 4056, Wavelet Applications VII; (2000) https://doi.org/10.1117/12.381711
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

With growing complexity of today's ICs, it is desirable to improve traditional testing methods to increase the IC manufacturing throughput. If one can select a limited number of points to test the circuit from a given test pattern, the time required for testing can be greatly reduced. This paper presents a method for circuit testing by combining the wavelet transform and test point selection. An example using an 8-bit D/A converter is used to demonstrate the algorithm.

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Hsing-Chiang Huang, Hsing-Chiang Huang, Andrew K. Chan, Andrew K. Chan, } "Test point selection using wavelet transforms for mixed-signal circuits", Proc. SPIE 4056, Wavelet Applications VII, (5 April 2000); doi: 10.1117/12.381711; https://doi.org/10.1117/12.381711

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