23 February 2000 Pointing out the structure of double layers through spectroscopic methods
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Proceedings Volume 4068, SIOEL '99: Sixth Symposium on Optoelectronics; (2000) https://doi.org/10.1117/12.378706
Event: SIOEL: Sixth Symposium of Optoelectronics, 1999, Bucharest, Romania
Abstract
This paper investigates the dependence of local emissivity, for two spectrum lines of helium, upon the location within a stationary double layer. The experimental result are explained starting from a new phenomenological model, which takes into account the non-elastic interactions between the accelerated electrons and the atoms of the working gas.
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Benedict Oprescu, Mircea Sanduloviciu, "Pointing out the structure of double layers through spectroscopic methods", Proc. SPIE 4068, SIOEL '99: Sixth Symposium on Optoelectronics, (23 February 2000); doi: 10.1117/12.378706; https://doi.org/10.1117/12.378706
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