PROCEEDINGS VOLUME 4070
ALT'99 INTERNATIONAL CONFERENCE: ADVANCED LASER TECHNOLOGIES | 20-24 SEPTEMBER 1999
ALT '99 International Conference on Advanced Laser Technologies
IN THIS VOLUME

0 Sessions, 63 Papers, 0 Presentations
ALT'99 INTERNATIONAL CONFERENCE: ADVANCED LASER TECHNOLOGIES
20-24 September 1999
Potenza-Lecce, Italy
Laser in Art Conservation
Proc. SPIE 4070, Laser diagnostics developed for conservation and restoration of cultural inheritance, 0000 (25 February 2000); doi: 10.1117/12.378139
Proc. SPIE 4070, Experimental comparison of three nondestructive testing diagnostics on pigments and ligands, 0000 (25 February 2000); doi: 10.1117/12.378149
Proc. SPIE 4070, Controlled laser ablation for the restoration of artwork: principles and applications, 0000 (25 February 2000); doi: 10.1117/12.378160
Proc. SPIE 4070, Laser cleaning of stones: assessment of operative parameters, damage thresholds, and associated optical diagnostics, 0000 (25 February 2000); doi: 10.1117/12.378171
Lidar Applications
Proc. SPIE 4070, Atmospheric monitoring by lidar in an industrial area of Southern Italy, 0000 (25 February 2000); doi: 10.1117/12.378182
Proc. SPIE 4070, New sensors for the Italian Antarctica Research Program, 0000 (25 February 2000); doi: 10.1117/12.378193
Proc. SPIE 4070, Lidar fluorosensor seawater monitoring during the Antarctic oceanographic campaign, 0000 (25 February 2000); doi: 10.1117/12.378198
Proc. SPIE 4070, Mobile CO2 lidar/DIAL station, 0000 (25 February 2000); doi: 10.1117/12.378199
Proc. SPIE 4070, Transmissivity measurements for atmospheric characterization, 0000 (25 February 2000); doi: 10.1117/12.378200
Proc. SPIE 4070, Atmospheric water vapor measurements using ground- and satellite-based instrumentation and radiosonde, 0000 (25 February 2000); doi: 10.1117/12.378140
Proc. SPIE 4070, Aerosol measurements by lidar in the nocturnal boundary layer, 0000 (25 February 2000); doi: 10.1117/12.378141
Proc. SPIE 4070, Simultaneous application of the Raman and DIAL techniques for ground-based water vapor lidar measurements in the nocturnal boundary layer, 0000 (25 February 2000); doi: 10.1117/12.378142
Proc. SPIE 4070, Study of atmospheric trace gases by sub-Doppler diode laser spectroscopy, 0000 (25 February 2000); doi: 10.1117/12.378143
Proc. SPIE 4070, First results obtained with a lidar fluorescence sensor system, 0000 (25 February 2000); doi: 10.1117/12.378144
Proc. SPIE 4070, Solar blind lidar for continuous monitoring of water vapor, 0000 (25 February 2000); doi: 10.1117/12.378138
Proc. SPIE 4070, Laser remote sensing of water, soil, and vegetation, 0000 (25 February 2000); doi: 10.1117/12.378145
Novel Laser Sources
Proc. SPIE 4070, Solid state active media with laser pumping, 0000 (25 February 2000); doi: 10.1117/12.378146
Proc. SPIE 4070, Unipolar semiconductor lasers on asymmetric quantum wells, 0000 (25 February 2000); doi: 10.1117/12.378147
Proc. SPIE 4070, High-efficiency high-power cw solid state lasers for material processing, 0000 (25 February 2000); doi: 10.1117/12.378148
Proc. SPIE 4070, Applications of powerful CO2 lasers in atomic industry, 0000 (25 February 2000); doi: 10.1117/12.378150
Laser Surface Processing
Proc. SPIE 4070, Physical modeling of interstellar dust, 0000 (25 February 2000); doi: 10.1117/12.378151
Proc. SPIE 4070, Dynamics of the vapor plumes produced by the MALDI technique, 0000 (25 February 2000); doi: 10.1117/12.378152
Proc. SPIE 4070, Laser-induced tissue ablation described by linear mass loss model, 0000 (25 February 2000); doi: 10.1117/12.378153
Proc. SPIE 4070, Chemical analysis of nanosecond laser ablation products, 0000 (25 February 2000); doi: 10.1117/12.378154
Proc. SPIE 4070, Structure and optical properties of silicon nanopowders produced by laser-induced SiH4 gas decomposition, 0000 (25 February 2000); doi: 10.1117/12.378155
Proc. SPIE 4070, Hard x-ray production from femtosecond plasma induced in clusterlike solids, 0000 (25 February 2000); doi: 10.1117/12.378156
Proc. SPIE 4070, Pulsed laser deposition of thin films on large substrates, 0000 (25 February 2000); doi: 10.1117/12.378157
Proc. SPIE 4070, Parametric studies of carbon nitride thin films deposited by reactive pulsed laser ablation, 0000 (25 February 2000); doi: 10.1117/12.378158
Proc. SPIE 4070, Excimer laser surface processing of Si3N4 and AlN, 0000 (25 February 2000); doi: 10.1117/12.378159
Proc. SPIE 4070, Excimer laser ablation of borocarbide targets, 0000 (25 February 2000); doi: 10.1117/12.378161
Proc. SPIE 4070, Theoretical modeling of the laser-solid-plasma interaction during UV laser ablation of metallic targets, 0000 (25 February 2000); doi: 10.1117/12.378162
Proc. SPIE 4070, Prompt electron emission characterization in UV laser ablation of metallic targets, 0000 (25 February 2000); doi: 10.1117/12.378163
Proc. SPIE 4070, Experimental and theoretical study of dual-crossed-beam pulsed laser deposition, 0000 (25 February 2000); doi: 10.1117/12.378164
Proc. SPIE 4070, Carbon nitride coherently grown on Si (111) substrates by pulsed laser irradiation, 0000 (25 February 2000); doi: 10.1117/12.378165
Proc. SPIE 4070, Aluminum nitride growth by reactive pulsed laser deposition, 0000 (25 February 2000); doi: 10.1117/12.378166
Proc. SPIE 4070, Photoinduced growth of dielectrics with excimer lamps, 0000 (25 February 2000); doi: 10.1117/12.378167
Proc. SPIE 4070, Old problems and new applications: equilibrium conditions for plasmas generated by laser-induced breakdown, 0000 (25 February 2000); doi: 10.1117/12.378168
Proc. SPIE 4070, Modeling of TiO plume expansion under laser ablation, 0000 (25 February 2000); doi: 10.1117/12.378169
Proc. SPIE 4070, UV laser ablation of silicon carbide ring surfaces for mechanical seal applications, 0000 (25 February 2000); doi: 10.1117/12.378170
Proc. SPIE 4070, Photoionization of metal atom-ammonia clusters formed in a supersonic beam, 0000 (25 February 2000); doi: 10.1117/12.378172
Proc. SPIE 4070, Sn(1-x)VxOy thin films deposited by pulsed laser ablation for gas sensing devices, 0000 (25 February 2000); doi: 10.1117/12.378173
Proc. SPIE 4070, Synthesis of metal-nitride films by pulsed laser deposition methods, 0000 (25 February 2000); doi: 10.1117/12.378174
Proc. SPIE 4070, Nanoscale simulation of indium phosphide epitaxy by molecular beam, 0000 (25 February 2000); doi: 10.1117/12.378175
Proc. SPIE 4070, Laser surface cleaning and real-time monitoring, 0000 (25 February 2000); doi: 10.1117/12.378176
Proc. SPIE 4070, Indium and tin oxide multilayered thin films as gas sensors based on reactive pulsed laser deposition, 0000 (25 February 2000); doi: 10.1117/12.378177
Proc. SPIE 4070, Experimental results on silicon annealing by a long-pulse high-power XeCl laser system, 0000 (25 February 2000); doi: 10.1117/12.378178
Proc. SPIE 4070, Numerical description of the interactions between plasma and high-intensity UV laser pulses of nanosecond duration, 0000 (25 February 2000); doi: 10.1117/12.378179
Proc. SPIE 4070, SEM analysis of bimode photodeposition-ablation cycles on the structural changes of laser-irradiated a-Se thin films, 0000 (25 February 2000); doi: 10.1117/12.378180
Proc. SPIE 4070, Temperature study of absorption and photoluminescence spectra of CdSxSe1-x films grown on quartz substrate by pulse laser ablation technique, 0000 (25 February 2000); doi: 10.1117/12.378181
Proc. SPIE 4070, Effects of structural properties and electric field distribution on the laser-damage threshold of HfO2 thin films, 0000 (25 February 2000); doi: 10.1117/12.378183
Proc. SPIE 4070, Thermodynamic and quantum statistic kinetic studies of electron-phonon relaxation by ablation of metals, 0000 (25 February 2000); doi: 10.1117/12.378184
Proc. SPIE 4070, Plasma-assisted pulsed laser deposition of titanium dioxide, 0000 (25 February 2000); doi: 10.1117/12.378185
Proc. SPIE 4070, Laser stereolithography for medical applications, 0000 (25 February 2000); doi: 10.1117/12.378186
Proc. SPIE 4070, Interaction of a high-intensity laser pulse with a surface: plasma generation, self-action, and instabilities, 0000 (25 February 2000); doi: 10.1117/12.378187
Proc. SPIE 4070, Laser processing of materials and structures for flat panel displays, 0000 (25 February 2000); doi: 10.1117/12.378188
Laser Surface Diagnostics
Proc. SPIE 4070, Laser investigation of metal ion adsorption on protein charge surface, 0000 (25 February 2000); doi: 10.1117/12.378189
Proc. SPIE 4070, Characterization of electrical and structural properties of ion-implanted GaAs by Raman scattering, 0000 (25 February 2000); doi: 10.1117/12.378190
Proc. SPIE 4070, Laser-induced breakdown spectroscopy for quantitative elemental analysis, 0000 (25 February 2000); doi: 10.1117/12.378191