24 April 2000 Comparative study of x-ray-flash-, e-beam-, and ion-beam-induced molecular ion continua fluorescence of rare gases
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Proceedings Volume 4071, International Conference on Atomic and Molecular Pulsed Lasers III; (2000); doi: 10.1117/12.383462
Event: International Conference on Atomic and Molecular Pulsed Lasers III, 1999, Tomsk, Russian Federation
Abstract
The fluorescence of dense rare gas targets has been produced and analyzed using X-ray flash, e-beam and ion beam as excitation techniques. For the first time to our knowledge an extended database of argon and krypton molecular UV emissions, i.e. the Molecular Ion Continua, has been obtained with a very good agreement between spectra whatever the pumping technics is used. The estimation of potential surface for both singly and doubly charged argon trimers and the consideration of previous ab initio calculation for the argon dimer enables us to confirm some former hypothesis but also to suggest new pathways likely to be at the origin of the population of the upper states radiating in the Molecular Ion Continua.
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Eric Robert, Christophe Cachoncinlle, Jean-Michel Pouvesle, Andrei V. Fedenev, Victor F. Tarasenko, Jochen Wieser, Andreas Ulrich, "Comparative study of x-ray-flash-, e-beam-, and ion-beam-induced molecular ion continua fluorescence of rare gases", Proc. SPIE 4071, International Conference on Atomic and Molecular Pulsed Lasers III, (24 April 2000); doi: 10.1117/12.383462; https://doi.org/10.1117/12.383462
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KEYWORDS
Argon

Luminescence

X-rays

Krypton

Roentgenium

Ion beams

Ions

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