22 May 2000 DSPI technique for nanometer vibration mode measurement
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Proceedings Volume 4072, Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (2000) https://doi.org/10.1117/12.386740
Event: 4th International Conference on Vibration Measurement by Laser Techniques, 2000, Ancona, Italy
Abstract
A time-average DSPI method for nanometer vibration mode measurement is presented in this paper. The phase continuous scan technique is combined with the Bessel fringe-shifting technique to quantitatively analyze the vibration mode by time-average DSPI is used in measurement system. Through the phase continuous scan, the background and speckle items are completely eliminated, which improves the fringe quality and enhances the signal-to-noise ratio of interferogram. There is no need to calibrate the optical phase-shifter exactly in this method. The anti-disturbance capability of this method is higher than that of the phase-stepping technique, so it is robust and easy to be used. In the vibration measurement system, the speckle average technology is used, so the high quality measuring results are obtained.
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Kaiduan Yue, Shuhai Jia, Yushan Tan, "DSPI technique for nanometer vibration mode measurement", Proc. SPIE 4072, Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 May 2000); doi: 10.1117/12.386740; https://doi.org/10.1117/12.386740
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