In-plane error analysis in ESPSI: the effect of beam divergence

W. S. Wan Abdullah; Jon N. Petzing; John Raymond Tyrer

doi:10.1117/12.397942

31 August 2000 In-plane error analysis in ESPSI: the effect of beam divergence

W. S. Wan Abdullah, Jon N. Petzing, John Raymond Tyrer

Proceedings Volume 4076, Optical Diagnostics for Industrial Applications; (2000) https://doi.org/10.1117/12.397942
Event: Symposium on Applied Photonics, 2000, Glasgow, United Kingdom

Abstract

The application of optical metrology using Electronics Speckle Pattern Shearing Interferometry (ESPSI) in industry, is becoming more prevalent as a method of quality assurance and non-destructive testing (NDT). ESPSI provides non-contact full-field inspection of the test object generating displacement derivative data. The trend of using ESPSI in quality assurance in NDT involves the desire for quantitative measurement. ESPSI may be used for out-of-plane displacement derivative (slope) measurements ((delta) w/(delta) x) or potentially in-plane slope measurements (such as (delta) u/(delta) x), depending on optical configurations and object boundary conditions. Current concern is focussed on accuracy of commercial ESPSI systems and questioning the extent of error compensation in the associated fringe software systems. This paper presents studies which have been analyzing in-plane derivative measurement accuracy, as a function of object illumination wave-front divergence. Theoretical error analysis supported by experimental analysis has been performed using restrained aluminum alloy cantilever beam. The relative error is measured by comparing displacement derivative data of measurements using divergent illumination with respect to collimated illumination. The measurement error has been found to be dependent on the direction of illumination and the shearing amount at a fixed distance, with certain combinations producing values exceeding 30%.

Citation Download Citation

W. S. Wan Abdullah, Jon N. Petzing, and John Raymond Tyrer "In-plane error analysis in ESPSI: the effect of beam divergence", Proc. SPIE 4076, Optical Diagnostics for Industrial Applications, (31 August 2000); https://doi.org/10.1117/12.397942

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
12 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Error analysis

Collimation

Interferometers

Cameras

Interferometry

Nondestructive evaluation

Inspection

Show All Keywords

Keywords/Phrases

Search In:

Publication Years