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9 May 2000 Low-cost miniaturized sensor based on optoelectronic integrated technique for industrial computed tomography (CT)
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Proceedings Volume 4077, International Conference on Sensors and Control Techniques (ICSC 2000); (2000) https://doi.org/10.1117/12.385534
Event: International Conference on Sensors and Control Techniques (ICSC2000), 2000, Wuhan, China
Abstract
Sensor, influencing on system's performances, is one of some key techniques in x-ray industrial computed tomography (CT) systems. Instead of common sensors such as temperature, humidity, pressure and optic fiber, the sensor used for detecting x- or (gamma) -ray in industrial CT system, generally is called nuclear radiation detector, so that the radiation energy involved in tested information can be transformed into electric signals easy to be measured. Considering the existing problems for sensor (or detector) in CT systems, a new sensor is experimented by using optoelectronic integrated technique with optic fiber face- plate for optically coupling and transmission, and it is beneficial to the performances with high integrated, high efficiency, high resolution, miniaturized and low cost in industrial CT systems.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Biao Wei, Yinshong Pan, and Wu Xian "Low-cost miniaturized sensor based on optoelectronic integrated technique for industrial computed tomography (CT)", Proc. SPIE 4077, International Conference on Sensors and Control Techniques (ICSC 2000), (9 May 2000); https://doi.org/10.1117/12.385534
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