Improve product aperture ratio by controlling magnitude of reverse tilt domain

WeiHsuan Ho; ChihJui Pan; H. H. Wu

doi:10.1117/12.389417

30 June 2000 Improve product aperture ratio by controlling magnitude of reverse tilt domain

WeiHsuan Ho, ChihJui Pan, H. H. Wu

Proceedings Volume 4079, Display Technologies III; (2000) https://doi.org/10.1117/12.389417
Event: Photonics Taiwan, 2000, Taipei, Taiwan

Abstract

In thin-film-transistor LCD, aperture ratio is an important parameter of transmittance. In this paper, we describe the relation between aperture ratio and reverse tilt domain. We conclude that we can control the magnitude of reverse tilt domain by changing rubbing density, pile impression, cell gap and altitude of TFT. Consequently, relatively large aperture ratio could be obtained by decreasing the area of black matrix.

Citation Download Citation

WeiHsuan Ho, ChihJui Pan, and H. H. Wu "Improve product aperture ratio by controlling magnitude of reverse tilt domain", Proc. SPIE 4079, Display Technologies III, (30 June 2000); https://doi.org/10.1117/12.389417

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