6 July 2000 Design and implementation of a new two-way optoelectronic probe for optical information processing components analysis
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Abstract
In this paper, a new two-way measurement method of optical signal processing elements is presented. The proposed method can decrease testing time and reduce human errors induced by disconnection in conventional one-way testing method. We can measure the scattering parameters of optical devices with fast two-way measurement when applying the new probes in conventional network analyzers. We demonstrated using our designed opto-electronic probes can measure the frequency responses of S21 and S12 of optical information processing component simultaneously. No reverse connections are needed for transfer functions measurement. In the future, this system can be applied to measure the characteristics of broadband optical signal processing elements for system applications. The theoretical model we built is very match to the experimental results.
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Shyh-Lin Tsao, Shyh-Lin Tsao, Tai-Chi Liou, Tai-Chi Liou, } "Design and implementation of a new two-way optoelectronic probe for optical information processing components analysis", Proc. SPIE 4081, Optical Storage and Optical Information Processing, (6 July 2000); doi: 10.1117/12.390512; https://doi.org/10.1117/12.390512
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