Analysis and study on measurement of jitter and its precision

Lijun Ma; Duanyi Xu; Longfa Pan

doi:10.1117/12.416855

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7 February 2001 Analysis and study on measurement of jitter and its precision

Lijun Ma, Duanyi Xu, Longfa Pan

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Proceedings Volume 4085, Fifth International Symposium on Optical Storage (ISOS 2000); (2001) https://doi.org/10.1117/12.416855
Event: Fifth International Symposium on Optical Storage (IS0S 2000), 2000, Shanghai, China

Abstract

Jitter is defined by the variation of each pit length and timing variations between data and clock frequency on discs. As a comprehensive item, it relates with error rate directly. In this paper, the definition, determined and influence factors of jitter n are analyzed. According to the analysis, measurement methods of jitter are provided. The precision of a method. The method's precision and demand are calculated and explained in detail.

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Lijun Ma, Duanyi Xu, and Longfa Pan "Analysis and study on measurement of jitter and its precision", Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); https://doi.org/10.1117/12.416855

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