Paper
7 February 2001 Effects of thermal treatment on the optical constants of GeTe, Sb2Te3, Ge2Sb2Te5 systems
Quan Xie, Lisong Hou, Hao Ruan, Jing Li, Jinyan Li, Fuxi Gan
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Proceedings Volume 4085, Fifth International Symposium on Optical Storage (ISOS 2000); (2001) https://doi.org/10.1117/12.416822
Event: Fifth International Symposium on Optical Storage (IS0S 2000), 2000, Shanghai, China
Abstract
The effects of thermal treatment on the dependence of optical constants on wavelength and the changes of optical constants of GeTe, Sb2Te3 and Ge2Sb2Te5 thin films at different annealing temperatures are studied. It can be found that the optical constants of GeTe, Sb2Te3 and Ge2Sb2Te5 thin films change with increasing annealing temperature. The crystallization speed changes with increasing Sb content, i.e.: the crystallization speed of GeTe < the crystallization speed of Ge2Sb2Te5 < the crystallization speed of Sb2Te3. The mechanism of the change of the optical constants of the GeTe, Sb2Te3 and Ge2Sb2Te5 systems due to thermal treatment is also analyzed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Quan Xie, Lisong Hou, Hao Ruan, Jing Li, Jinyan Li, and Fuxi Gan "Effects of thermal treatment on the optical constants of GeTe, Sb2Te3, Ge2Sb2Te5 systems", Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); https://doi.org/10.1117/12.416822
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KEYWORDS
Ferroelectric materials

Crystals

Refractive index

Thin films

Thermal effects

Antimony

Tellurium

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