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7 February 2001 Near-line inspector of optical disk parameters
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Proceedings Volume 4085, Fifth International Symposium on Optical Storage (ISOS 2000); (2001)
Event: Fifth International Symposium on Optical Storage (IS0S 2000), 2000, Shanghai, China
In this paper, a new kind of automatic method to test the Parameters of CD/DVD Optical Discs is introduced and named near-line inspector. Being connected to product lines, sampling and testing the discs automatically in batches, our inspector can provide a brief yet revealing profile of optical disc parameters such as electrical variables (HF, Jitter, etc.), physical variables and digital error variables in an acceptable short time so as to reflect the up-to-date condition of the product lines. As a real-time and relatively high-efficiency measurement method, it will be integrated into a perfect test system together with on-line and off-line inspectors. Such a system would be especially suitable for the replication of high-quality optical discs in large volume. The layout of the whole set of test system is described. The feasibility and reliability of near-line method are analyzed based on study by means of a high-precision DVD off-line test system developed by us.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Desheng Meng, Lijun Ma, Longfa Pan, and Lei Zhang "Near-line inspector of optical disk parameters", Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001);


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