7 February 2001 Novel measuring system for mechanical characteristics of optical disks
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Proceedings Volume 4085, Fifth International Symposium on Optical Storage (ISOS 2000); (2001) https://doi.org/10.1117/12.416813
Event: Fifth International Symposium on Optical Storage (IS0S 2000), 2000, Shanghai, China
Abstract
Measuring mechanical characteristics of optical disk is very significant. This paper compares the existing measuring methods and gives a novel method we adopted in details. Some measuring results are also shown.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haiwei Wang, Haiwei Wang, Xiandeng Pei, Xiandeng Pei, Changsheng Xie, Changsheng Xie, Benxi Liu, Benxi Liu, "Novel measuring system for mechanical characteristics of optical disks", Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416813; https://doi.org/10.1117/12.416813
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