7 February 2001 Thickness error analysis of multilayers for recordable and phase-change optical disks
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Proceedings Volume 4085, Fifth International Symposium on Optical Storage (ISOS 2000); (2001); doi: 10.1117/12.416827
Event: Fifth International Symposium on Optical Storage (IS0S 2000), 2000, Shanghai, China
Abstract
The film thickness of optical disk multilayer is difficult to be precisely controlled in the actual coating process. The thickness error becomes a main factor influencing the optical characters of the film system. The thickness error sensitivity factor of dielectric optical multilayer is derived from the optical matrix in this paper. The applications to recordable and phase-change optical disk systems are given. The effect of the thickness error on the reflectivity or reflectivity contrast of the optical disk multilayer is analyzed with a computer numerical calculation. The sensitivities to thickness error for different layers or in different film-thickness ranges are compared and discussed. A sketchy method of defining allowable thickness error is given. These results have guidance significance to the design of film layer and the optimization of coating technology in the optical disk systems.
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Yang Wang, Donghong Gu, Fuxi Gan, "Thickness error analysis of multilayers for recordable and phase-change optical disks", Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416827; https://doi.org/10.1117/12.416827
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KEYWORDS
Optical discs

Reflectivity

Multilayers

Error analysis

Coating

Dielectrics

Optical matrix switches

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