29 November 2000 AFM study on silver/HOPG interface sputtered by low-energy argon ions
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Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408475
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
The effect of argon ion bombardment on interface of silver and high oriented pyrogenic graphite (HOPG) was investigated by atomic force microscopy. The Ag/HOPG interface morphology has been explored as a function of irradiation time. It can be seen that the size of crystal particle on HOPG is almost unchanged with increase of irradiation time, while the size of Ag crystal particle in part of the terrace increased and became highly ordered. There is no obvious mixing between Ag and HOPG, and Ag particles in nanoscale are isolated on HOPG surface. This will result in the reduction of depth resolution of the surface analysis by ion sputtering technique.
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De-Quan Yang, De-Quan Yang, Yuqing Xiong, Yuqing Xiong, Weigang Lu, Weigang Lu, Yun Guo, Yun Guo, Dao-an Da, Dao-an Da, } "AFM study on silver/HOPG interface sputtered by low-energy argon ions", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408475; https://doi.org/10.1117/12.408475
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