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29 November 2000 Evaluation of ZnO films produced by a single-step deposition on optical fibers
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Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408480
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
The effectiveness of Single Source Chemical Vapor Deposition as a one step process for producing zinc oxide films on silica fibers was evaluated. The physical and chemical properties of films grown on optical fibers and films grown on planar silica substrates under identical conditions were probed for differences using X-Ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). The XPS analysis of the film surface and bulk found no significant variation in the chemical composition between films grown on planar substrates and films grown on optical fibers. The XRD of films grown on planar silica substrates showed these films to be composed of crystallites roughly 30 - 40 nm in size and oriented in the c-axis direction. SEM revealed some differences in the morphology between standard grown on planar silica substrates and growth on silica fibers although films in both cases were composed of columns of crystallites. Although it was found that film thickness varied around the circumference of the silica fiber relative to the position of the precursor source, the films were nevertheless continuous and consistent in chemical composition.
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E. Y.M. Lee, Leong Mar, and Robert N. Lamb "Evaluation of ZnO films produced by a single-step deposition on optical fibers", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408480
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