Paper
29 November 2000 Kinetic scaling of fractal growth of thin films
Fengmin Wu, Yunzhang Fang, Qiaowen Li, Ziqin Wu
Author Affiliations +
Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408437
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
The fractal growth of 2D thin films on metal surface is studied by means of kinetic Monte Carlo simulation, using realistic growth model and physical parameters. Emphasis is given to time dependence of the size S(t) and branch width b(t) of the island. It is found that the island size S(t) grows with time t as tk, where growth-exponent k is slightly less than one when averaged from all islands. Similar results for the branch width of islands are also obtained from the simulations are not very low coverage, i.e., b(t) (infinity) t(alpha ). The kinetic scaling values k and (alpha) of fractal growth of thin films may be helpful to understand the growth mechanism of thin films.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fengmin Wu, Yunzhang Fang, Qiaowen Li, and Ziqin Wu "Kinetic scaling of fractal growth of thin films", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408437
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KEYWORDS
Fractal analysis

Thin films

Thin film growth

Chemical species

Monte Carlo methods

Diffusion

Silver

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