29 November 2000 Kinetic scaling of fractal growth of thin films
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Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408437
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
The fractal growth of 2D thin films on metal surface is studied by means of kinetic Monte Carlo simulation, using realistic growth model and physical parameters. Emphasis is given to time dependence of the size S(t) and branch width b(t) of the island. It is found that the island size S(t) grows with time t as tk, where growth-exponent k is slightly less than one when averaged from all islands. Similar results for the branch width of islands are also obtained from the simulations are not very low coverage, i.e., b(t) (infinity) t(alpha ). The kinetic scaling values k and (alpha) of fractal growth of thin films may be helpful to understand the growth mechanism of thin films.
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Fengmin Wu, Fengmin Wu, Yunzhang Fang, Yunzhang Fang, Qiaowen Li, Qiaowen Li, Ziqin Wu, Ziqin Wu, } "Kinetic scaling of fractal growth of thin films", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408437; https://doi.org/10.1117/12.408437
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