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29 November 2000 Optical properties and the mechanism of BaxSr1-xTiO3 ferroelectric thin films prepared by sol-gel method
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Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408347
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
Ultraviolet-visible spectrophotometer was used to study optical properties of BaxSr1-xTiO3 (BST) system ferroelectric thin films derived by sol-gel process. Transmission spectrum show that the thickness, refractive index and the optical band gap of films on fused silica are changed with annealing conditions due to the densification with pore collapse and the phase transformation. The refractive index n of BaTiO3, Ba0.7Sr0.3TiO3, SrTiO3, and Ba0.7Sr0.3TiO3+1at%Mn thin films annealed at 800 degree(s)C are about 1.987, 1.902, 1.8 and 2.044 at 450 nm, 550 nm, 650 nm, and 550 nm, respectively. The bandgap of well-crystallized BST thin films is about 3.63 eV.
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Chengyu Jin and Zhongyan Meng "Optical properties and the mechanism of BaxSr1-xTiO3 ferroelectric thin films prepared by sol-gel method", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408347
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