24 May 2000 Tolerance stackup effects in optical interconnect systems
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Proceedings Volume 4089, Optics in Computing 2000; (2000) https://doi.org/10.1117/12.386783
Event: 2000 International Topical Meeting on Optics in Computing (OC2000), 2000, Quebec City, Canada
Abstract
This paper presents a study of the effects of the accumulation of positioning errors across multiple optical components (also named `tolerance stackup') on the optical power throughput performance of free-space optical interconnects. It is shown that a sensitivity analysis is not adequate to establish a tolerance budget as it provides no information regarding the system yield upon assembly. The effects of tolerance stackup across a system are more severe than a statistical root-sum-square type analysis predicts. It is demonstrated that errors accumulate linearly with interconnect length.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederic K. Lacroix, Frederic K. Lacroix, Andrew G. Kirk, Andrew G. Kirk, } "Tolerance stackup effects in optical interconnect systems", Proc. SPIE 4089, Optics in Computing 2000, (24 May 2000); doi: 10.1117/12.386783; https://doi.org/10.1117/12.386783
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