24 October 2000 Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf light-emitting diode
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Abstract
A modified ellipsometric optical system has been designed for an in-vitro medical diagnostic instrument using an off- the-shelf 525-nm LED source. System requirements included a 20 degree (+/- 1 deg) incident angle, 1 uW (min) assay surface incident power, 300 um (max) incident spot diameter (full spatial extent) and 500:1 (min) detector S/N in normal room light. The fixed polarization ellipsometric optical analysis method is discussed, and the lens prescription used in a prototype instrument is given. Zemas spot size analyses are given, as well as a theoretical model for S/N assessment. Incident spot size and optical power data are provided which agree with the theory presented. Finally, the application of results and typical scanned signal output are discussed.
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Stephen M. Tobin, Shao Yang, "Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf light-emitting diode", Proc. SPIE 4093, Current Developments in Lens Design and Optical Systems Engineering, (24 October 2000); doi: 10.1117/12.405218; https://doi.org/10.1117/12.405218
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