29 September 2000 Determination of geometric properties of SNOM tips by means of far-field evaluation
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Abstract
Scanning near field optical microscopes provide access to highly resolved optical and topographical surface properties. The resolutions that can be achieved are better than 100 nm. However, the quality of the optical fiber tip is of decisive importance. Because the production process of pulled and coated glass fiber tips is still highly empirical and error-prone, a technique would be useful to determine the tips' quality before they are shipped to the user or mounted in the microscope.
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Soenke Seebacher, Soenke Seebacher, Wolfgang Osten, Wolfgang Osten, Werner P. O. Jueptner, Werner P. O. Jueptner, Vadim P. Veiko, Vadim P. Veiko, Nikolay B. Voznesensky, Nikolay B. Voznesensky, } "Determination of geometric properties of SNOM tips by means of far-field evaluation", Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); doi: 10.1117/12.401617; https://doi.org/10.1117/12.401617
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