Research on the near-field distribution of nanometric apertures: fiber optic probes and the influence of parameters of metal-coated probes

Xiumei Liu; Jia Wang

doi:10.1117/12.401621

29 September 2000 Research on the near-field distribution of nanometric apertures: fiber optic probes and the influence of parameters of metal-coated probes

Xiumei Liu, Jia Wang

Author Affiliations +

Proceedings Volume 4098, Optical Devices and Diagnostics in Materials Science; (2000) https://doi.org/10.1117/12.401621
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

In this paper near-field distributions of nanometric apertures, the uncoated and metal-coated fiber-optic probes used in near-field scanning optical microscope are characterized by the method of finite-difference time- domain. Moreover, to give a clear view of the influence of parameters, say, the taper angle ((alpha) ), the aperture diameter (d), the refractive index of the fiber-optic (n) and the sample (ns), the tip-sample separation (z), on the throughput of metal-coated fiber-optic probes, we investigated it in detail.

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Xiumei Liu and Jia Wang "Research on the near-field distribution of nanometric apertures: fiber optic probes and the influence of parameters of metal-coated probes", Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); https://doi.org/10.1117/12.401621

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