2 November 2000 Calibration tool for a CCD-camera-based vision system
Author Affiliations +
A special calibration tool has been developed for a CCD camera based vision system in an automatic assembly machine. The machine is used to attach orifice plates onto a silicon wafer in a production process. The center locations of the positioning circular holes on the plate must be controlled accurately to coincide with those on the wafer die before they are attached together by UV curing. Although CCD camera based vision systems are widely used for accurate positioning and dimensional measurements in precision engineering, electronics and semiconductor industry, their calibrations are normally done by artefacts with plane patterns. These artefacts are therefore restricted to only two dimensional measurements. The calibration tool we developed was to check the positioning accuracy of circular objects in a two-layered structure. It can also be used to determine parallax errors, non-linearity and spatial non- uniformity errors as well as repeatability of the vision system with an uncertainty at sub-micrometer level. The design, calibration and performance of the tool are described in detail in this paper.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gan Xu, Siew Leng Tan, Siok Pheng Low, Yee Shuai Heng, Weng Chuen Lai, Xianhe Du, "Calibration tool for a CCD-camera-based vision system", Proc. SPIE 4099, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries, (2 November 2000); doi: 10.1117/12.405815; https://doi.org/10.1117/12.405815


CCD cameras

Semiconducting wafers


Imaging systems




The Interferometric Analysis Of Flatness By Eye And Computer
Proceedings of SPIE (September 06 1978)
Thinned 4096x4096 CCD mosaic
Proceedings of SPIE (May 01 1994)
Ultraviolet Mirau correlation microscopy
Proceedings of SPIE (April 10 1997)
Optical Measuring Technology Of The Micropatterns
Proceedings of SPIE (July 17 1979)

Back to Top