PROCEEDINGS VOLUME 4100
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
Scattering and Surface Roughness III
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
Scattering Theory and Anaylsis I
Proc. SPIE 4100, Surface plasmon polariton propagation near an index step, 0000 (26 September 2000); doi: 10.1117/12.401646
Proc. SPIE 4100, Scattering of electromagnetic waves from one-dimensionally rough surfaces containing surface resonant structures, 0000 (26 September 2000); doi: 10.1117/12.401655
Proc. SPIE 4100, Small slope approximation method: scattering of a vector wave from 2D dielectric and metallic surfaces with Gaussian and non-Gaussian statistics, 0000 (26 September 2000); doi: 10.1117/12.401662
Proc. SPIE 4100, Light scattering resonances in arbitrarily shaped one-dimensional reentrant surfaces, 0000 (26 September 2000); doi: 10.1117/12.401664
Proc. SPIE 4100, Effective impedance boundary condition for the coherent scattering of light from a one-dimensional randomly rough surface, 0000 (26 September 2000); doi: 10.1117/12.401665
Proc. SPIE 4100, Numerical study of an inverse scattering algorithm for perfectly conducting one-dimensional surfaces, 0000 (26 September 2000); doi: 10.1117/12.401666
Proc. SPIE 4100, Wavelength dependence of the light scattered from a dielectric film deposited on a metal substrate, 0000 (26 September 2000); doi: 10.1117/12.401667
Rough Surface Scattering
Proc. SPIE 4100, Wolf effect from a real image as a secondary source, 0000 (26 September 2000); doi: 10.1117/12.401668
Proc. SPIE 4100, Amplified backscattering from dye-doped polymer bounded with 1D rough metal film, 0000 (26 September 2000); doi: 10.1117/12.401647
Proc. SPIE 4100, Simulation of the optical behavior of rough identical multilayers, 0000 (26 September 2000); doi: 10.1117/12.401648
Proc. SPIE 4100, Modeling of surface roughness: application to physical properties of paper, 0000 (26 September 2000); doi: 10.1117/12.401649
Scattering Theory and Analysis II
Proc. SPIE 4100, Band-limited uniform diffuser in transmission, 0000 (26 September 2000); doi: 10.1117/12.401650
Proc. SPIE 4100, Numerical study of the resolution in a model near-field optical microscope, 0000 (26 September 2000); doi: 10.1117/12.401651
Poster Session
Proc. SPIE 4100, Light scattering by periodic roughness at dielectric surface, 0000 (26 September 2000); doi: 10.1117/12.401652
Surface Roughness: Instruments and Application
Proc. SPIE 4100, Design problems of a calibrated BRDF sensor with respect to dynamic range, speed, and large angle of view, 0000 (26 September 2000); doi: 10.1117/12.401653
Proc. SPIE 4100, Polarized light-scattering measurements of polished and etched steel surfaces, 0000 (26 September 2000); doi: 10.1117/12.401654
Proc. SPIE 4100, AFM data analysis: separating surface microtopography from instrumental artifacts, 0000 (26 September 2000); doi: 10.1117/12.401656
Proc. SPIE 4100, Rapid detection of surface defects by x-ray scanning, 0000 (26 September 2000); doi: 10.1117/12.401657
Proc. SPIE 4100, In-process characterization of surface topography changes during nitration, 0000 (26 September 2000); doi: 10.1117/12.401658
Proc. SPIE 4100, Measuring surface roughness in transmission geometry, 0000 (26 September 2000); doi: 10.1117/12.401659
Poster Session
Proc. SPIE 4100, Conformal mapping approximation to scattering from surfaces with Koch corrugation, 0000 (26 September 2000); doi: 10.1117/12.401660
Scattering Theory and Analysis II
Proc. SPIE 4100, Modeling anisotropic scattering surfaces in illumination software, 0000 (26 September 2000); doi: 10.1117/12.401661
Surface Roughness: Instruments and Application
Proc. SPIE 4100, Development problems of a nanometer coordinate measuring machine (NCMM), 0000 (26 September 2000); doi: 10.1117/12.401663
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