PROCEEDINGS VOLUME 4101
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
Laser Interferometry X: Techniques and Analysis
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
New Techniques
Proc. SPIE 4101, Laser-diode phase-shifting interferometer applied to joint-transform correlator, 0000 (7 March 2006); doi: 10.1117/12.498391
Proc. SPIE 4101, Visualization of Berry spin-redirection phase in polarization interferometer with geometric shear, 0000 (7 March 2006); doi: 10.1117/12.498420
Proc. SPIE 4101, Spatio-temporal approach to shape and motion measurements of 3D objects, 0000 (7 March 2006); doi: 10.1117/12.498390
Proc. SPIE 4101, Evaluation of phase changes of interferograms during continuous deformations, 0000 (7 March 2006); doi: 10.1117/12.498449
Fringe Pattern Analysis
Proc. SPIE 4101, Coordinate transform method for closed fringe analysis, 0000 (7 March 2006); doi: 10.1117/12.498424
Proc. SPIE 4101, Choosing a phase-measurement algorithm for measurement of coated LIGO optics, 0000 (7 March 2006); doi: 10.1117/12.498386
Proc. SPIE 4101, Minimization of systematic errors in phase-shifting interferometry: evaluation of residuals, 0000 (7 March 2006); doi: 10.1117/12.498384
Proc. SPIE 4101, Distortion correction method for aspheric optical testing, 0000 (7 March 2006); doi: 10.1117/12.498428
Holography and ESPI
Proc. SPIE 4101, Hybrid optical-computational methodology for studies and optimization of microelectronic components, 0000 (7 March 2006); doi: 10.1117/12.498385
Proc. SPIE 4101, Radial in-plane interferometer for ESPI measurement, 0000 (7 March 2006); doi: 10.1117/12.498423
Proc. SPIE 4101, Low-coherence videoholography for subsurface deformation measurements in layered objects, 0000 (7 March 2006); doi: 10.1117/12.498431
Proc. SPIE 4101, Investigation of photorefractive properties of pure and dye-doped nematic liquid crystals for dynamic holography devices, 0000 (7 March 2006); doi: 10.1117/12.498394
ESPI and ESPSI
Proc. SPIE 4101, Influence of unresolved speckles in interferometric phase measurements, 0000 (7 March 2006); doi: 10.1117/12.498433
Proc. SPIE 4101, Shadow moire method for the measurement of the source position in three-dimensional shearography, 0000 (7 March 2006); doi: 10.1117/12.498429
Proc. SPIE 4101, Shape measurement by source displacement in three-dimensional shearography, 0000 (7 March 2006); doi: 10.1117/12.498430
Optical Micromeasurement
Proc. SPIE 4101, Estimation of inside stress of microcantilever: investigation of measuring principle using macro-model, 0000 (7 March 2006); doi: 10.1117/12.498436
Proc. SPIE 4101, AFM scanning moire method for nanodeformation measurement, 0000 (7 March 2006); doi: 10.1117/12.498437
Proc. SPIE 4101, Optimization of plasma-deposited silicon oxinitride films for interferometric MOEMS applications, 0000 (7 March 2006); doi: 10.1117/12.498439
Proc. SPIE 4101, Submicrometric profilometry of nonrotationally symmetrical surfaces using the Ronchi test, 0000 (7 March 2006); doi: 10.1117/12.498438
Optical Profilometry
Proc. SPIE 4101, High-resolution measurement of extended technical surfaces with scalable topometry, 0000 (7 March 2006); doi: 10.1117/12.498445
Proc. SPIE 4101, Improved fast white-light scanning profilometer, 0000 (7 March 2006); doi: 10.1117/12.498419
Proc. SPIE 4101, Three-dimensional profilometry using moire pattern projection, 0000 (7 March 2006); doi: 10.1117/12.498432
Proc. SPIE 4101, Novel aperture connection method for measurement of surface with rotation axis, 0000 (7 March 2006); doi: 10.1117/12.498434
Poster Session
Proc. SPIE 4101, Fringe formation in a dual-beam symmetric illumination-observation TV holography system: an analysis, 0000 (7 March 2006); doi: 10.1117/12.498450
Proc. SPIE 4101, Polarization phase shifting in white-light interferometry, 0000 (7 March 2006); doi: 10.1117/12.498448
Proc. SPIE 4101, Compensation techniques in speckle interferometry, 0000 (7 March 2006); doi: 10.1117/12.498447
Proc. SPIE 4101, New phase-stepping algorithm based on the self-consistent concept, 0000 (7 March 2006); doi: 10.1117/12.498435
Proc. SPIE 4101, Interferometry measurement of laser-induced plasma density and improvement, 0000 (7 March 2006); doi: 10.1117/12.498427
Proc. SPIE 4101, Optical processing of interference patterns, 0000 (7 March 2006); doi: 10.1117/12.498421
Proc. SPIE 4101, New algorithm insensitive to both translational and tilt phase-shifting error for phase-shifting interferometry, 0000 (7 March 2006); doi: 10.1117/12.498408
Proc. SPIE 4101, Precise angle monitor based on the concept of pencil-beam interferometry, 0000 (7 March 2006); doi: 10.1117/12.498388
Proc. SPIE 4101, Linear integer unconcerned phase-maps Fourier-transform profilometry by changing the angle of projection, 0000 (7 March 2006); doi: 10.1117/12.498422
Proc. SPIE 4101, Effective error reduction method in phase-shifting interferometer, 0000 (7 March 2006); doi: 10.1117/12.498409
Displacement, Vibration, and Dynamic Measurements
Proc. SPIE 4101, Heisenberg principle applied to fringe analysis, 0000 (7 March 2006); doi: 10.1117/12.498381
Proc. SPIE 4101, Holographic interferometry and its application in brake vibration and noise analysis, 0000 (7 March 2006); doi: 10.1117/12.498401
Proc. SPIE 4101, Particle analysis with digital holography, 0000 (7 March 2006); doi: 10.1117/12.498399
Proc. SPIE 4101, Study of internal deformation fields in granular materials using 3D digital speckle x-ray flash photography, 0000 (7 March 2006); doi: 10.1117/12.498392
Distance and Shape Measurements
Proc. SPIE 4101, Image formation in phase-shifting digital holography, 0000 (7 March 2006); doi: 10.1117/12.498395
Proc. SPIE 4101, Distance measurements by three-beam optical feedback interferometry, 0000 (7 March 2006); doi: 10.1117/12.498414
Proc. SPIE 4101, Real-time chirp control of an external-cavity semiconductor laser for absolute distance measurement, 0000 (7 March 2006); doi: 10.1117/12.498413
Proc. SPIE 4101, Measurement and control of the bending of x-ray mirrors using speckle interferometry, 0000 (7 March 2006); doi: 10.1117/12.498444
Proc. SPIE 4101, Resolution improvements of the digital light-in-flight recording by holography method, 0000 (7 March 2006); doi: 10.1117/12.498443
Strain, Stress, and Deformation Measurements
Proc. SPIE 4101, New generation of optical extensometers based on grating (moire) interferometry, 0000 (7 March 2006); doi: 10.1117/12.498389
Proc. SPIE 4101, Surface strain characterization using time-division-multiplexed 3D shearography, 0000 (7 March 2006); doi: 10.1117/12.498404
Proc. SPIE 4101, Mechanical testing using digital speckle photography, 0000 (7 March 2006); doi: 10.1117/12.498442
Proc. SPIE 4101, Strain/displacement of a carabiner via interferometry, 0000 (7 March 2006); doi: 10.1117/12.498410
NDT and Materials Characterization
Proc. SPIE 4101, Interferometry in the optics research group: an overview, 0000 (7 March 2006); doi: 10.1117/12.498441
Proc. SPIE 4101, Shearography system for the testing of large-scale aircraft components taking into account noncooperative surfaces, 0000 (7 March 2006); doi: 10.1117/12.498440
Proc. SPIE 4101, Indication of deformations on the surface of toroidal objects by an optoelectronic method, 0000 (7 March 2006); doi: 10.1117/12.498393
Proc. SPIE 4101, Optical techniques for the evaluation of thermo-functional gradients in human dentine, 0000 (7 March 2006); doi: 10.1117/12.498411
Optical Surface Characterization
Proc. SPIE 4101, Detection and compensation of misalignment for interferometric diagnostic tools applied in space-borne facilities, 0000 (7 March 2006); doi: 10.1117/12.498398
Proc. SPIE 4101, Characterization of micro-optics using digital holography, 0000 (7 March 2006); doi: 10.1117/12.498397
Proc. SPIE 4101, Application of a Ronchi technique to quality control of ophthalmic surfacing, 0000 (7 March 2006); doi: 10.1117/12.498416
Proc. SPIE 4101, Model-based optimization of interferometers for testing aspherical surfaces, 0000 (7 March 2006); doi: 10.1117/12.498406
Proc. SPIE 4101, Interferometer calibration: an approach with the virtual interferometer, 0000 (7 March 2006); doi: 10.1117/12.498405