PROCEEDINGS VOLUME 4103
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
Optical Diagnostic Methods for Inorganic Materials II
Editor(s): Leonard M. Hanssen
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
UV Materials and Detector Metrology
Proc. SPIE 4103, Evaluation of fused silica for DUV laser application by short-time diagnostics, 0000 (11 October 2000); https://doi.org/10.1117/12.403569
Refractive Index and Birefringence Measurements
Proc. SPIE 4103, Further evaluation of the Exicor birefringence measurement system, 0000 (11 October 2000); https://doi.org/10.1117/12.403586
Proc. SPIE 4103, Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 um using generalized ellipsometry, 0000 (11 October 2000); https://doi.org/10.1117/12.403587
Proc. SPIE 4103, Comparison of AC laser calorimeter measurements with FTIR measurements of superconductors, 0000 (11 October 2000); https://doi.org/10.1117/12.403588
Proc. SPIE 4103, Infrared refractive index measurements using a new method, 0000 (11 October 2000); https://doi.org/10.1117/12.403589
Optical Standards Methodology
Proc. SPIE 4103, Intercomparison of regular spectral transmittance and reflectance measurements with FTIR- and monochromator-based spectrophotometers, 0000 (11 October 2000); https://doi.org/10.1117/12.403570
Proc. SPIE 4103, Comparison and development of absorption peak determination algorithms for wavelength standards, 0000 (11 October 2000); https://doi.org/10.1117/12.403571
Proc. SPIE 4103, Alternative methods of optical diagnostics in the field of standardization and metrology, 0000 (11 October 2000); https://doi.org/10.1117/12.403572
Methods for Reflectance and Transmittance of Specular Materials
Proc. SPIE 4103, Angle-dependent absolute infrared reflectance and transmittance measurements, 0000 (11 October 2000); https://doi.org/10.1117/12.403573
Proc. SPIE 4103, Reflectometer for pseudo-Brewster angle spectrometry (BAIRS), 0000 (11 October 2000); https://doi.org/10.1117/12.403574
Proc. SPIE 4103, Characterization of Si-on-insulator buried layers by FTIR and scatterometry, 0000 (11 October 2000); https://doi.org/10.1117/12.403575
Methods for Reflectance and Transmittance of Scattering Materials
Proc. SPIE 4103, Microscopic spectrophotometry applied to quasifractal gold particle clusters, 0000 (11 October 2000); https://doi.org/10.1117/12.403576
Proc. SPIE 4103, Anisotropy of paper: comparison of different laser tools, 0000 (11 October 2000); https://doi.org/10.1117/12.403577
Methods for Emittance and Absorptance
Proc. SPIE 4103, Fourier transform spectrometer for thermal-infrared emissivity measurements near room temperatures, 0000 (11 October 2000); https://doi.org/10.1117/12.403578
Proc. SPIE 4103, Development of an adiabatic laser calorimeter, 0000 (11 October 2000); https://doi.org/10.1117/12.403579
Proc. SPIE 4103, Measurement technique for obtaining the extraordinary-ray absorption coefficient of uniaxial crystals, 0000 (11 October 2000); https://doi.org/10.1117/12.403580
Poster Session
Proc. SPIE 4103, Simple method for the birefringence evaluation of helicoidal optical fiber structures, 0000 (11 October 2000); https://doi.org/10.1117/12.403581
Proc. SPIE 4103, Mueller-polarimetry diagnostics method of synthetic ionite granule dimension distribution, 0000 (11 October 2000); https://doi.org/10.1117/12.403582
Proc. SPIE 4103, Near-grazing-angle reflectometry of absorbing media, 0000 (11 October 2000); https://doi.org/10.1117/12.403583
Proc. SPIE 4103, Testing the accuracy of a laser calorimeter by comparison with an FTIR, 0000 (11 October 2000); https://doi.org/10.1117/12.403584
Methods for Reflectance and Transmittance of Scattering Materials
Proc. SPIE 4103, Ceramic surface polariton sensor, 0000 (11 October 2000); https://doi.org/10.1117/12.403585
Back to Top