Angle-dependent absolute infrared reflectance and transmittance measurements

Simon G. Kaplan; Leonard M. Hanssen

doi:10.1117/12.403573

11 October 2000 Angle-dependent absolute infrared reflectance and transmittance measurements

Simon G. Kaplan, Leonard M. Hanssen

Proceedings Volume 4103, Optical Diagnostic Methods for Inorganic Materials II; (2000) https://doi.org/10.1117/12.403573
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A goniometric system is used in conjunction with an FT-IR (Fourier- Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12$DEG to 80$DEG. The input beam is polarized using a high-quality Ge reflective Brewster-angle polarizer, and is focussed onto the sample with an approximately f/50 geometry. The average angle of incidence is controlled to within +/- 0.05$DEG, and spectra are recorded for both s- and p-polarization over a wavelength range of 1.6 (mu) m to 5.2 (mu) m, using a photoconductive InSb detector. Measurement results are compared to the predictions of the Fresnel equations in order to assess the accuracy of the instrument.

Citation Download Citation

Simon G. Kaplan and Leonard M. Hanssen "Angle-dependent absolute infrared reflectance and transmittance measurements", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); https://doi.org/10.1117/12.403573

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