11 October 2000 Further evaluation of the Exicor birefringence measurement system
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Abstract
We recently developed a linear birefringence measurement instrument, known as the Exicor system, using photoelastic modulator (PEM) technology. We have reported the precision and short-term stability of this instrument. In this paper, the author further evaluates the accuracy, long-term stability, and instrumental performance under low light intensity levels of the Exicor system.
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Baoliang Bob Wang, Baoliang Bob Wang, } "Further evaluation of the Exicor birefringence measurement system", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); doi: 10.1117/12.403586; https://doi.org/10.1117/12.403586
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