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11 October 2000 Further evaluation of the Exicor birefringence measurement system
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Abstract
We recently developed a linear birefringence measurement instrument, known as the Exicor system, using photoelastic modulator (PEM) technology. We have reported the precision and short-term stability of this instrument. In this paper, the author further evaluates the accuracy, long-term stability, and instrumental performance under low light intensity levels of the Exicor system.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Baoliang Bob Wang "Further evaluation of the Exicor birefringence measurement system", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); https://doi.org/10.1117/12.403586
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