11 October 2000 Infrared refractive index measurements using a new method
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A complete independent method is used to measure the infrared refractive index of sapphire as a function of temperature and frequency. The technique combines single frequency and broadband measurements. The refractive index at the wavelength 3.39 (mu) m is measured using prism and the minimum deviation method. A laser interferometer and an etalon of the material are then used to measure the thermo-optic coefficient. A broadband FTIR spectrometer is used to measure the transmittance spectrum of the etalon and then a fringe counting method is applied to obtain the frequency dependent refractive index. The technique is applied to sapphire over the temperature range from 10K to 1000K and wavelength range from 1 to 5 (mu) m. High accuracy is demonstrated. The errors of this experimental approach are analyzed.
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Di Yang, Michael E. Thomas, William J. Tropf, Simon G. Kaplan, "Infrared refractive index measurements using a new method", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); doi: 10.1117/12.403589; https://doi.org/10.1117/12.403589

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