A simple, robust reflectometer, pre-set for several angles of incidence (AOI), has been designed and used for determining the optical parameters of opaque samples having a specular surface. A single, linear polarizing element permits the measurement of perpendicular(s) and parallel (p) reflectence at each AOI. The BAIRS algorithm determines the empirical optical parameters for the subject surface at the pseudo-Brewster AOI, based on the measurement of p/s at two AOI's and, in turn the optical constants n and k (or (epsilon) 1 and (epsilon) 2). Radiation sources in current use, are a stabilized tungsten-halide lamp or a deuterium lamp for the visible and near UV spectral regions. Silica fiber optics and lenses deliver input and output radiation from the source and to a CCD array scanned diffraction spectrometer. Results for a sample of GaAs will be presented along with a discussion of dispersion features in the optical constant spectra.
Roy F. Potter, Roy F. Potter,
"Reflectometer for pseudo-Brewster angle spectrometry (BAIRS)", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); doi: 10.1117/12.403574; https://doi.org/10.1117/12.403574