2 February 2001 Degradation in tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light-emitting devices (OLEDs)
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Abstract
Poor device stability has been a major concern for organic light emitting devices (OLEDs). The relatively short operational lifetime of the OLEDs is predominantly attributed to an intrinsic degradation behavior, which leads to a decrease in the electroluminescence quantum efficiency of the devices in time. Recently, we found that the injection of holes in tris(8-hydroxyquinoline) aluminum (AlQ3), the most widely used organic electroluminescent material, is the main factor responsible for the intrinsic degradation behavior in OLEDs. The photoluminescence quantum efficiency of AlQ3 has been found to decrease as a result of predominantly hole current flow. Further studies using time-resolved fluorescence measurements reveal that degradation is also associated with a decrease in the lifetime of the AlQ3 excited states, thus revealing the nature of the degradation products as luminescence quenchers. Various phenomena pertaining to device degradation will be discussed.
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Hany Aziz, Zoran D. Popovic, Nan-Xing Hu, Paulo DosAnjos, Andronique Ioannidis, "Degradation in tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light-emitting devices (OLEDs)", Proc. SPIE 4105, Organic Light-Emitting Materials and Devices IV, (2 February 2001); doi: 10.1117/12.416901; https://doi.org/10.1117/12.416901
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