Paper
29 November 2000 Depth profiling of the χ2 distribution in poled nonlinear optical polymer films
Robert Blum, Kersten Pfeifer, Manfred Eich
Author Affiliations +
Abstract
We present experimental and theoretical details on how to analyze the polarization distribution in poled second order nonlinear optical polymers in three dimensions. The polar order can be analyzed in both the lateral and the vertical directions by scanning second harmonic microscopy (SSHM) at various wavelengths along the absorption tail of the polymer. Local thermal reorientation was accomplished using an Argon laser at a wavelength of 488nm, and the resulting change in polarization was analyzed by multi-(lambda) SSHM. We could demonstrate that the relative change in polarization is strongest at the surface that was irradiated with the Argon laser and decreases towards the opposite surface.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Blum, Kersten Pfeifer, and Manfred Eich "Depth profiling of the χ2 distribution in poled nonlinear optical polymer films", Proc. SPIE 4106, Linear, Nonlinear, and Power-Limiting Organics, (29 November 2000); https://doi.org/10.1117/12.408500
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polymers

Absorption

Electrodes

Argon ion lasers

Polarization

Polymer thin films

Microscopy

Back to Top