18 December 2000 All-fibered measurement design for cw-calibrated MMIC electro-optic probing
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For the future design of MMIC for communication application it is important to have probing tools to enhance the chip design. This paper describes improvement in the electro- optic probing technique using a continuous wave semiconductor laser beam for MMIC on gallium arsenide base. In our all-fiber system the laser beam is focused on the chip and the reflection changes are measured. With the Fabry-Perot response of the circuit itself it is possible to calibrate and calculate the voltage between front and back side of the circuits for the points beside the micro strip structures of the integrated chip. We used this technique to trace the distribution of the electric field beside a micro strip line.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Didier Erasme, Didier Erasme, Stefan Lauffenburger, Stefan Lauffenburger, Bernard Huyart, Bernard Huyart, Philipp O. Mueller, Philipp O. Mueller, "All-fibered measurement design for cw-calibrated MMIC electro-optic probing", Proc. SPIE 4111, Terahertz and Gigahertz Electronics and Photonics II, (18 December 2000); doi: 10.1117/12.422132; https://doi.org/10.1117/12.422132


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