15 November 2000 Spectral polarization signatures of materials in the LWIR
Author Affiliations +
Abstract
The emitted polarization signature of materials is of interest for use in discriminating targets from cluttered backgrounds. In addition, spectrally varying polarization signatures might be used for material identification or to separate target and environment radiance contributions. A spectrally filtered LWIR Imaging Polarimeter (LIP) has been constructed and used in the lab and in the field to make signature measurements of controlled targets. In addition, a full-stokes FTIR Polarization Spectrometer (FSP) has been constructed for higher spectral resolution measurements of materials. This paper will discuss the instruments, calibration methods, general operation, and results characterizing the emitted polarization properties of materials as a function of wavelength.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matthew P. Fetrow, Matthew P. Fetrow, Stephanie H. Sposato, Stephanie H. Sposato, Kenneth P. Bishop, Kenneth P. Bishop, Thomas R. Caudill, Thomas R. Caudill, "Spectral polarization signatures of materials in the LWIR", Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406633; https://doi.org/10.1117/12.406633
PROCEEDINGS
12 PAGES


SHARE
Back to Top