Paper
13 December 2000 Event screening for the Chandra X-Ray Observatory High-Resolution Camera (HRC)
Stephen S. Murray, John H. Chappell, Almus T. Kenter, Michael Juda, Ralph Porter Kraft, Martin V. Zombeck, Gary R. Meehan, Gerald K. Austin, Joaquim J. Gomes
Author Affiliations +
Abstract
The Chandra X-ray Observatory High Resolution Camera is an improved version of similar Microchannel Plate (MCP) based detectors that were previously used on the Einstein and ROSAT X-ray observatories. The HRC consists of two detectors in a common housing, and sharing some processing electronics. Only one detector operates at a time. The HRC-I is a 100 mm X 100 mm device that is used for wide field of view imaging with sub-arcsecond angular resolution. The HRC-S is a 300 mm X 30 mm device that is used to readout the Low Energy Transmission Grating Spectrometer (LETGS) providing very high spectral resolution. The main differences from previous missions are the larger format MCP's, radioisotope free MCP glass, and an active Cosmic Ray anti-coincidence shield. Event processing in the HRC is limited to digitizing selected signals from the readout device and transmitting these to the ground. As a result, it is possible to examine and screen the data during processing. Algorithms have been developed to identify non-X-ray events thereby reducing the detector background. Event screening can also detect and filter out 'bad' events that might otherwise degrade image quality.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen S. Murray, John H. Chappell, Almus T. Kenter, Michael Juda, Ralph Porter Kraft, Martin V. Zombeck, Gary R. Meehan, Gerald K. Austin, and Joaquim J. Gomes "Event screening for the Chandra X-Ray Observatory High-Resolution Camera (HRC)", Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000); https://doi.org/10.1117/12.409108
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Cited by 8 scholarly publications.
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KEYWORDS
Amplifiers

X-rays

Microchannel plates

Sensors

Calibration

Observatories

X-ray detectors

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