Translator Disclaimer
13 December 2000 Fitting method for analyzing polarized x-rays on CCD camera
Author Affiliations +
CCDs can function as the X-ray spectrometer by counting the number of electrons created by the ionization of semiconductor atoms following the photoelectric absorption of an X-ray photon. In order to measure the incident X-ray energy correctly, we have to sum up all the electrons split over several pixels, thus the grade method is conventionally used. We will discuss the possible alternative to this method -- the fitting method --, which has several advantages over the grade method. By applying this method to the data taken with our CCD chip, we will show that the fitting method can improve the quantum efficiency, is applicable to the analysis of polarized X-ray events, and gives us insights on the structure of CCDs.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masahiro Tsujimoto, Hiroshi Murakami, Kenji Hamaguchi, Takeshi G. Tsuru, Hisamitsu Awaki, and Katsuji Koyama "Fitting method for analyzing polarized x-rays on CCD camera", Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000);


X-Ray Detectors : A Review
Proceedings of SPIE (November 27 1989)
RINGO3: a multi-colour fast response polarimeter
Proceedings of SPIE (September 24 2012)
A study of electron multiplying CCDs for use on the...
Proceedings of SPIE (July 20 2010)
Application of a charge coupled device as an x ray...
Proceedings of SPIE (February 15 1994)
High-performance CCD on high-resistivity silicon
Proceedings of SPIE (August 18 1998)
Frame store PN-CCD detector for space applications
Proceedings of SPIE (February 03 2004)

Back to Top