21 November 2000 Characterization of CZT detectors grown from horizontal and vertical Bridgman
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Abstract
Various types of Cd1-xZnxTe (0.04 < X < 0.24) detector crystals grown by vertical high pressure Bridgman (VHPB), low pressure Bridgman (LPB) i.e. vertical ambient pressure Bridgman (VB), horizontal ambient pressure Bridgman (HB) and vapor grown crystals have been evaluated and compared. We have used the following methods in order to evaluate the CZT: (1) Triaxial crystal x-ray diffraction (TAD) for determination of the surface crystalline homogeneity, (2) Nuclear spectroscopic response of detectors and (3) Sensitivity to radiation from high flux x-rays for investigations of the suitability for x-ray digital imaging. Finally a comparison between the various methods of CZT crystal growth will be given.
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Haim Hermon, Haim Hermon, Michael M. Schieber, Michael M. Schieber, Mark S. Goorsky, Mark S. Goorsky, Terrance Thiem Lam, Terrance Thiem Lam, Evgenie Meerson, Evgenie Meerson, H. Walter Yao, H. Walter Yao, Jay Chris Erickson, Jay Chris Erickson, Ralph B. James, Ralph B. James, } "Characterization of CZT detectors grown from horizontal and vertical Bridgman", Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407580; https://doi.org/10.1117/12.407580
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