21 November 2000 Characterization of multi-element CZT arrays
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Abstract
We report on device fabrication and testing of CZT grown by the Modified Vertical Bridgman (MVB) method. Several samples of single-crystal MVB grown CZT were obtained from Yinnel Tech. Both single element devices and 2-dimensional arrays were fabricated. Resistivity and electron mobility-lifetime product were measured, and pulse height spectra were recorded for various isotopic sources. Arrays 5 mm thick and an array 1.13-cm thick were evaluated.
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Leonard J. Cirignano, Leonard J. Cirignano, Kanai S. Shah, Kanai S. Shah, Paul R. Bennett, Paul R. Bennett, Longxia Li, Longxia Li, Fengying Lu, Fengying Lu, Joseph Buturlia, Joseph Buturlia, H. Walter Yao, H. Walter Yao, Gomez W. Wright, Gomez W. Wright, Ralph B. James, Ralph B. James, } "Characterization of multi-element CZT arrays", Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407600; https://doi.org/10.1117/12.407600
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