21 November 2000 Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals
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Abstract
Various passivating agents that reduce the surface leakage current of CZT crystals have been previously reported. In none of the studies, NH4F/H2O2 was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH4F/H2O2 treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH4F/H2O2 surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH4F/H2O2 treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.
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Gomez W. Wright, Gomez W. Wright, Ralph B. James, Ralph B. James, Douglas Chinn, Douglas Chinn, Bruce Andrew Brunett, Bruce Andrew Brunett, Richard W. Olsen, Richard W. Olsen, John M. Van Scyoc, John M. Van Scyoc, W. Miles Clift, W. Miles Clift, Arnold Burger, Arnold Burger, Kaushik Chattopadhyay, Kaushik Chattopadhyay, Detang T. Shi, Detang T. Shi, Robert Cam Wingfield, Robert Cam Wingfield, } "Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals", Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407594; https://doi.org/10.1117/12.407594
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