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18 December 2000 Measurement of coincidence timing resolution with CdTe detectors
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Abstract
The coincidence timing resolution is a critical performance parameter to determine if direct gamma-ray detection by semiconductor detector material such as CdTe or CdZnTe may be suitable for use in positron emission tomography systems. We report experimental results of the coincidence timing resolution measured with a pair of 2 by 2 by 10 mm3 CdTe detectors irradiated by 511 keV gamma rays under conditions that allow good timing resolution and good energy resolution to be obtained simultaneously. The measured coincidence time resolutions ranged from 14 ns to 24 ns. We also found that the coincidence timing resolution was proportional to the signal rise time, and that both of these were proportional to the electron transit time.
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Yiping Shao, H. Bradford Barber, Stephen J. Balzer, and Simon R. Cherry "Measurement of coincidence timing resolution with CdTe detectors", Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); https://doi.org/10.1117/12.410570
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