PROCEEDINGS VOLUME 4143
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
X-Ray FEL Optics and Instrumentation
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
Source Properties, Diagnostics, and Beamlines
Proc. SPIE 4143, Radiation properties of the Linac Coherent Light Source: challenges for x-ray optics, 0000 (25 January 2001); https://doi.org/10.1117/12.413677
Proc. SPIE 4143, Photon beamlines at TESLA X-FEL undulators, 0000 (25 January 2001); https://doi.org/10.1117/12.413687
Proc. SPIE 4143, Civil engineering for the X-FEL multiuser facility at DESY, 0000 (25 January 2001); https://doi.org/10.1117/12.413688
Time-Resolved Measurements with Subpicosecond X-Ray Pulses
Proc. SPIE 4143, X-ray FEL: an experimenter's dilemma, 0000 (25 January 2001); https://doi.org/10.1117/12.413689
Optical Issues
Proc. SPIE 4143, Wavefront calculations, 0000 (25 January 2001); https://doi.org/10.1117/12.413679
Proc. SPIE 4143, Compound refractive lenses: high-quality imaging optics for the X-FEL, 0000 (25 January 2001); https://doi.org/10.1117/12.413680
Proc. SPIE 4143, Femtosecond x-ray dynamical diffraction by perfect crystals, 0000 (25 January 2001); https://doi.org/10.1117/12.413681
Proc. SPIE 4143, X-ray photon storage in a crystal cavity, 0000 (25 January 2001); https://doi.org/10.1117/12.413682
Proc. SPIE 4143, Performance studies of a multilayer-based radiation pulse slicer for Linac Coherent Light Source (LCLS) applications, 0000 (25 January 2001); https://doi.org/10.1117/12.413683
Proc. SPIE 4143, X-ray interferometric diffraction topography of crystal imperfections, 0000 (25 January 2001); https://doi.org/10.1117/12.413684
Proc. SPIE 4143, Future metrology needs for FEL reflective optics, 0000 (25 January 2001); https://doi.org/10.1117/12.413685
Proc. SPIE 4143, Focusing coherent x-rays with refractive optics, 0000 (25 January 2001); https://doi.org/10.1117/12.413686
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