PROCEEDINGS VOLUME 4143
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
X-Ray FEL Optics and Instrumentation
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
Source Properties, Diagnostics, and Beamlines
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 1 (25 January 2001); doi: 10.1117/12.413677
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 9 (25 January 2001); doi: 10.1117/12.413687
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 14 (25 January 2001); doi: 10.1117/12.413688
Time-Resolved Measurements with Subpicosecond X-Ray Pulses
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 20 (25 January 2001); doi: 10.1117/12.413689
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 26 (25 January 2001); doi: 10.1117/12.413690
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 38 (25 January 2001); doi: 10.1117/12.413678
Optical Issues
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 48 (25 January 2001); doi: 10.1117/12.413679
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 60 (25 January 2001); doi: 10.1117/12.413680
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 69 (25 January 2001); doi: 10.1117/12.413681
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 78 (25 January 2001); doi: 10.1117/12.413682
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 89 (25 January 2001); doi: 10.1117/12.413683
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 103 (25 January 2001); doi: 10.1117/12.413684
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 98 (25 January 2001); doi: 10.1117/12.413685
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, pg 109 (25 January 2001); doi: 10.1117/12.413686
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