25 January 2001 X-ray interferometric diffraction topography of crystal imperfections
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Abstract
A method for X-ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that using double and triple interferometers one can detect segregation lines, displacement lines, as well as the Moire patterns of imperfections of different types.
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Arsen O. Aboyan, Arsen O. Aboyan, Arpat S. Avanesyan, Arpat S. Avanesyan, } "X-ray interferometric diffraction topography of crystal imperfections", Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, (25 January 2001); doi: 10.1117/12.413684; https://doi.org/10.1117/12.413684
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